The case of using CMOS FD-SOI rather than CMOS bulk to harden ICs against laser attacks
Jean-Max Dutertre,
Vincent Beroulle,
Philippe Candelier,
Louis-Barthelemy Faber,
Marie-Lise Flottes,
Philippe Gendrier,
David Hély,
Regis Leveugle,
Paolo Maistri,
Giorgio Di Natale,
others
Laser fault injection at the CMOS 28 nm technology node: an analysis of the fault model
Jean-Max Dutertre,
Vincent Beroulle,
Philippe Candelier,
Stephan De Castro,
Faber Louis-Barthelemy,
Marie-Lise Flottes,
Gendrier Philippe,
David Hely,
Régis Leveugle,
Paolo Maistri,
others
Laser-induced fault effects in security-dedicated circuits
Régis Leveugle,
Paolo Maistri,
Pierre Vanhauwaert,
Feng Lu,
Giorgio Di Natale,
Marie-Lise Flottes,
Bruno Rouzeyre,
Athanasios Papadimitriou,
David Hély,
Vincent Beroulle,
Guillaume Hubert,
Stephan De Castro,
Jean-Max Dutertre,
Alexandre Sarafianos,
Noemie Boher,
Mathieu Lisart,
Joel Damiens,
Philippe Candelier,
Clément Tavernier
Laser-Induced Fault Effects in Security-Dedicated Circuits
Vincent Beroulle,
Philippe Candelier,
Stephan De Castro,
Giorgio Di Natale,
Jean-Max Dutertre,
Marie-Lise Flottes,
David Hély,
Guillaume Hubert,
Régis Leveugle,
Feng Lu,
Paolo Maistri,
Athanasios Papadimitriou,
Bruno Rouzeyre,
Clément Tavernier,
Pierre Vanhauwaert