Laser fault injection at the CMOS 28 nm technology node: an analysis of the fault model

Jean-Max Dutertre, Vincent Beroulle, Philippe Candelier, Stephan De Castro, Faber Louis-Barthelemy, Marie-Lise Flottes, Gendrier Philippe, David Hely, Régis Leveugle, Paolo Maistri, others

January 2018

Type

Conference paper

Publication

FDTC 2018–Fourteenth Workshop on Fault Diagnosis and Tolerance in Cryptography