David Hely
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Laser fault injection at the CMOS 28 nm technology node: an analysis of the fault model
Analysis of laser-induced errors: RTL fault models versus layout locality characteristics
On fault injections for early security evaluation vs. laser-based attacks
On the development of a new countermeasure based on a laser attack RTL fault model
Validation of RTL laser fault injection model with respect to layout information
A multiple fault injection methodology based on cone partitioning towards RTL modeling of laser attacks
Laser-Induced Fault Effects in Security-Dedicated Circuits
Laser-induced fault effects in security-dedicated circuits
On error models for RTL security evaluations
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