Paolo Maistri

Latest

• Laser fault injection at the CMOS 28 nm technology node: an analysis of the fault model
• The case of using CMOS FD-SOI rather than CMOS bulk to harden ICs against laser attacks
• Analysis of laser-induced errors: RTL fault models versus layout locality characteristics
• On fault injections for early security evaluation vs. laser-based attacks
• On the development of a new countermeasure based on a laser attack RTL fault model
• Validation of RTL laser fault injection model with respect to layout information
• A multiple fault injection methodology based on cone partitioning towards RTL modeling of laser attacks
• Laser-Induced Fault Effects in Security-Dedicated Circuits
• Laser-induced fault effects in security-dedicated circuits
• On error models for RTL security evaluations