Marie-Lise Flottes

Latest

• Laser fault injection at the CMOS 28 nm technology node: an analysis of the fault model
• The case of using CMOS FD-SOI rather than CMOS bulk to harden ICs against laser attacks
• Laser-Induced Fault Effects in Security-Dedicated Circuits
• Laser-induced fault effects in security-dedicated circuits
• Securing Scan Control in Crypto Chips
• A secure scan design methodology
• Secure Scan Techniques: A Comparison
• Test control for secure scan designs
• Scan Design and Secure Chip