David Hely
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Read rate profile monitoring for defect detection in RFID Systems
Gilles Fritz
,
Boutheina Maaloul
,
Vincent Beroulle
,
Oum-El-Kheir Aktouf
,
David Hély
January 2011
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Conference paper
Publication
2011 IEEE International Conference on RFID-Technologies and Applications, RFID-TA 2011, Sitges, Spain, September 15-16, 2011
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