Towards a robust and efficient EM based authentication of FPGA against counterfeiting and recycling

Authentication field programmable gate arrays Field programmable gate arrays FPGA IC radiated electromagnetic emission semiconductor industry reliability integrated circuit design integrated circuit reliability process variation authentication aging Aging aging effects counterfeit efficient cost EM EM based authentication fingerprint fingerprints integrated circuits counterfeiting low cost Probes PV effects recycling reliability effects robust solution scheme measurements Stress Transistors variability-aware circuit design