David Hely
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EPC Class 1 GEN 2 UHF RFID tag emulator for robustness evaluation and improvement
Omar Abdelmalek
,
David Hély
,
Vincent Beroulle
January 2013
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Conference paper
Publication
Proceedings of the 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, DTIS 2013, 26-28 March, 2013, Abu Dhabi, UAE
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