Frédéric Bancel

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• Electronic circuit comprising a test mode secured by insertion of decoy data in the test chain, associated method
• Integrated circuit comprising a test mode secured by the use of an identifier, and associated method
• Electronic circuit comprising a test mode secured by the breaking of a test chain, and associated electronic circuit
• Detection of a disturbance in the state of an electronic circuit flip-flop
• Integrated circuit comprising a test mode secured by detection of the state of a control signal
• Method and device for securing the reading of a memory
• Protecting an integrated circuit test mode
• Protecting an integrated circuit test mode
• Integrated circuit having configurable cells and a secured test mode
• Method for testing an electronic circuit comprising a test mode secured by the use of a signature, and associated electronic circuit
• Method of securing the test mode of an integrated circuit via intrusion detection
• Securing Scan Control in Crypto Chips
• A secure scan design methodology
• Secure Scan Techniques: A Comparison
• Test control for secure scan designs
• Scan Design and Secure Chip